OmniScan instruments are recognised for their abilities in portable phased array ultrasonic testing (PAUT). The new OmniScan X3 flaw detector is said to be fast and efficient, while the total focusing method (TFM) images collected through full matrix capture (FMC) could be set to give users more confidence in their decision making. When an inspection is complete, leading-edge software tools are also anticipated to make analysis and reporting easier.
The OmniScan X3 flaw detector combines the essential tools needed for PAUT inspections, such as TOFD, two UT channels, eight groups and 16:64PR, 16:128PR and 32:128PR configurations.
The onboard scan plan tool also enables users to visualise the inspection, helping to reduce the risk of errors. The entire scan plan, including the TFM zone, can be created in one workflow. Creating a setup is also said to be faster, with improved calibration tools and support for simultaneous probe and beam set configuration, onboard dual linear, matrix and dual matrix array creation as well as automatic wedge verification.
Certified IP65 dust proof and water resistant, the instrument is said to be reliable and easy to use, with high-quality images that help to make interpreting flaws more obvious. With TFM, users can produce geometrically correct images to confirm the characterisation of flaws identified through conventional phased array techniques, and obtain better images throughout the volume of a part. Additional features include a 16-bit A-scan, interpolation and smoothing, and a vivid 10.6 in WXGA display that provides clarity and visibility in any light.
The OmniScan X3 flaw detector is also said to make analysis and reporting faster, both onboard the instrument and on a PC. The instrument additionally comes with a variety of helpful data interpretation tools.
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